Random Testing of Digital Circuits: Theory and Applications
Language: English
Published by CRC Press, 1998
- Hardcover
- New

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- Title
- Random Testing of Digital Circuits: Theory and Applications
- Author
- David, Rene
- Publisher
- CRC Press
- Publication year
- 1998
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0824701828
- ISBN 13
- 9780824701826
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
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About the Author
Rene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France.
"About the title" may belong to another edition of this title.
California Books
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