A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 460 pages, 224 b/w illus. 10 tables. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 730. . 2008. Revised ed. paperback. . . . . Books ship from the US and Ireland.

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Bibliographic Details

Title: Reflection Electron Microscopy and spectotrophy for surface analysis
Publisher: Cambridge University Press
Publication Date: 2005
Language: English
ISBN 10: 0521017955
ISBN 13: 9780521017954
Binding: Soft cover
Condition: New

About this title

Synopsis

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.

Book Description

In this book, RHEED, REM and REELS techniques are comprehensively reviewed for the first time. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. The book is written for materials scientists and graduate students and is entirely self-contained. FORTRAN source codes are provided for calculating crystal structure data and electron energy-loss spectra in different scattering geometries.

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