Reliability Analysis of Electrotechnical Devices
Language: English
Published by Mdpi AG, 2022
- Hardcover
- New

Seller: Rarewaves.com USA, London, London, United KingdomRarewaves.com USA
AbeBooks seller since June 11, 2025
Condition: New
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Add to basketSeller Inventory # LU-9783036546537
- Title
- Reliability Analysis of Electrotechnical Devices
- Author
- Tan, Cher Ming
- Publisher
- Mdpi AG
- Publication year
- 2022
- Condition
- New
- Binding
- Hardback
- Language
- English
- ISBN 10
- 3036546537
- ISBN 13
- 9783036546537
- Item weight
- 576 grams
This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
"Synopsis" may belong to another edition of this title.
Rarewaves.com USA
London, London, United Kingdom
AbeBooks seller since June 11, 2025
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