Title: Reliability and Degradation of III-V Optical Devices (Artech House Optoelectronics Library)
Publisher: Artech House Publishers
Publication Date: 1996
Language: English
ISBN 10: 0890066523
ISBN 13: 9780890066522
Binding: Hardcover
Condition: New

About this title

Synopsis

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

About the Author

Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

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