Reliability of Microtechnology: Interconnects, Devices and Systems
Language: English
Published by Springer, 2014
- Softcover
- New
Seller: California Books, Miami, FL, U.S.A.California Books
AbeBooks seller since October 27, 2023
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Add to basketSeller Inventory # I-9781489982117
- Title
- Reliability of Microtechnology: Interconnects, Devices and Systems
- Author
- Liu, Johan; Salmela, Olli; Sarkka, Jussi; Morris, James E.; Tegehall, Per-Erik; Andersson, Cristina
- Publisher
- Springer
- Publication year
- 2014
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 1489982116
- ISBN 13
- 9781489982117
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.
The book also includes exercises and detailed solutions at the end of each chapter.
"Synopsis" may belong to another edition of this title.
From the Back Cover
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also:
- Discusses the general failure mechanisms of microsystems on a component level
- Offers comprehensive coverage of solder joint reliability at the microsystems level
- Analyzes�quality issues and manufacturing at the microsystems level
Reliability of Microtechnology is an ideal volume for researchers and professional engineers working in reliability and manufacturing. The book also includes exercises and detailed solutions at the end of each chapter.
"About the title" may belong to another edition of this title.
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