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Bibliographic Details

Title: Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)
Publisher: J. Wiley
Publication Date: 1981
Language: English
ISBN 10: 0471280283
ISBN 13: 9780471280286
Binding: Hardcover
Condition: good

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Book by Howes, M. J., Morgan, David Vernon

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