Reliability of embedded systems design techniques and case analysis (2nd Edition)(Chinese Edition)

WU YE QING . WANG GUANG HUI DENG ZHU

ISBN 10: 7512418949 / ISBN 13: 9787512418943

Published by Beijing University of Aeronautics and Astronautics Press, 2015

About this Item

Language:Chinese.Paperback. Pub Date: 2015-11-01 Publisher: Beijing University of Aeronautics and Astronautics Press Embedded system reliability design technology and case analysis (2nd Edition) describes the embedded system design. where most likely to bring reliable sexual problems. as well as on how to design prevention. Content includes: startup and steady operation state of stress and differences in the reliability of the basic knowledge and methods; derating parameters and selection met.

Seller Inventory # CX020314

Bibliographic Details

• Title: Reliability of embedded systems design techniques and case analysis (2nd Edition)(Chinese Edition)
• Publisher: Beijing University of Aeronautics and Astronautics Press
• Publication Date: 2015
• Language: Chinese
• ISBN 10: 7512418949
• ISBN 13: 9787512418943
• Binding: paperback
• Condition: New

About this title

Synopsis

Language:Chinese.Paperback. Pub Date: 2015-11-01 Publisher: Beijing University of Aeronautics and Astronautics Press Embedded system reliability design technology and case analysis (2nd Edition) describes the embedded system design. where most likely to bring reliable sexual problems. as well as on how to design prevention. Content includes: startup and steady operation state of stress and differences in the reliability of the basic knowledge and methods; derating parameters and selection methods derating factor; quantitative calculation method selection and testing of the fan and heat sink. structures and circuits thermal design specification; PCB board layout layout. EMC measures system structure; electronics manufacturing process failure factors (including EOS. ESD. MSD. etc.) and prevention. testing methods; maintainability design specifications. availability design spec...