Resonant X-Ray Scattering in Correlated Systems (Springer Tracts in Modern Physics, 269). This item is unavailable.
Language: English
Published by Springer, 2018
- Softcover
- New
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
5-star seller
AbeBooks seller since March 25, 2015
Unavailable
Softcover
Condition: New
US$ 178.13
Item description from seller
In English.
Seller Inventory # ria9783662571224_new
- Title
- Resonant X-Ray Scattering in Correlated Systems (Springer Tracts in Modern Physics, 269)
- Publisher
- Springer
- Publication year
- 2018
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 3662571226
- ISBN 13
- 9783662571224
- Item weight
- 479 grams
- Series
- Book 204 of 227: Springer Tracts in Modern Physics
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
"Synopsis" may belong to another edition of this title.
About the Author
Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan.
Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.
"About the title" may belong to another edition of this title.