Run-to-Run Control in Semiconductor Manufacturing
Language: English
Published by Taylor & Francis Group, 2000
- Hardcover
- New

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pp. 368.
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- Title
- Run-to-Run Control in Semiconductor Manufacturing
- Publisher
- Taylor & Francis Group
- Publication year
- 2000
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0849311780
- ISBN 13
- 9780849311789
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
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About the Author
James Moyne, Enrique del Castillo, Arnon M. Hurwitz
"About the title" may belong to another edition of this title.
Books Puddle
Woodside, NY, U.S.A.
4-star seller
AbeBooks seller since November 22, 2018
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