SEM, EDAX & AFM study of ZnTe films deposited using SILAR method

Language: English

Published by LAP LAMBERT Academic Publishing Mär 2014, 2014

3659258296 / 9783659258299

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book. 64 pp. Englisch.

Seller Inventory # 9783659258299

Title
SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Author
Jignesh Rathod
Publisher
LAP LAMBERT Academic Publishing Mär 2014
Publication year
2014
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3659258296
ISBN 13
9783659258299
Item weight
113 grams
Dimensions
220x150x4 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

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BuchWeltWeit Ludwig Meier e.K.

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