Sampling, Wavelets, and Tomography

Language: English

Published by Birkhäuser Boston Dez 2003, 2003

0817643044 / 9780817643041

Series: Book 12 of 88 - Applied and Numerical Harmonic Analysis

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Sampling, wavelets, and tomography are three active areas of contemporary mathematics sharing common roots that lie at the heart of harmonic and Fourier analysis. The advent of new techniques in mathematical analysis has strengthened their interdependence and led to some new and interesting results in the field. This state-of-the-art book not only presents new results in these research areas, but it also demonstrates the role of sampling in both wavelet theory and tomography. Specific topics covered include:\* Robustness of Regular Sampling in Sobolev Algebras \* Irregular and Semi-Irregular Weyl-Heisenberg Frames \* Adaptive Irregular Sampling in Meshfree Flow Simulation \* Sampling Theorems for Non-Bandlimited Signals \* Polynomial Matrix Factorization, Multidimensional Filter Banks, and Wavelets \* Generalized Frame Multiresolution Analysis of Abstract Hilbert Spaces \* Sampling Theory and Parallel-Beam Tomography \* Thin-Plate Spline Interpolation in Medical Imaging \* Filtered Back-Projection Algorithms for Spiral Cone Computed TomographyAimed at mathematicians, scientists, and engineers working in signal and image processing and medical imaging, the work is designed to be accessible to an audience with diverse mathematical backgrounds. Although the volume reflects the contributions of renowned mathematicians and engineers, each chapter has an expository introduction written for the non-specialist. One of the key features of the book is an introductory chapter stressing the interdependence of the three main areas covered. A comprehensive index completes the work.Contributors: J.J. Benedetto, N.K. Bose, P.G. Casazza, Y.C. Eldar, H.G. Feichtinger, A. Faridani, A. Iske, S. Jaffard, A. Katsevich, S. Lertrattanapanich, G. Lauritsch, B. Mair, M. Papadakis, P.P. Vaidyanathan, T. Werther, D.C. Wilson, A.I. Zayed 372 pp. Englisch.…

Seller Inventory # 9780817643041

Title
Sampling, Wavelets, and Tomography
Author
Ahmed I. Zayed
Publisher
Birkhäuser Boston Dez 2003
Publication year
2003
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0817643044
ISBN 13
9780817643041
Item weight
723 grams
Dimensions
241x160x25 mm
Series
Book 12 of 88: Applied and Numerical Harmonic Analysis

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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First itemUS$ 25.84US$ 25.84
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BuchWeltWeit Ludwig Meier e.K.

Germany