Satistical and Machine learning approaches: 707 (Wiley Series in Computational Statistics)

Language: English

Published by John Wiley & Sons, 2012

0470195150 / 9780470195154

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pp. 344 Index Illustrated edition , 1865, 32nd Cross, BSK 2nd Stage, Bangalore560070.

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Title
Satistical and Machine learning approaches: 707 (Wiley Series in Computational Statistics)
Author
Matthias Dehmer Subhash C. Basak
Publisher
John Wiley & Sons
Publication year
2012
Condition
New
Binding
Hardcover
Language
English
ISBN 10
0470195150
ISBN 13
9780470195154

Books Puddle

New York, NY, U.S.A.

4-star seller

AbeBooks seller since November 22, 2018

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