Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)

Reimer, Ludwig

ISBN 10: 3642083722 / ISBN 13: 9783642083723

Published by Springer, 2010

About this Item

Seller Inventory # I-9783642083723

Bibliographic Details

• Title: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
• Publisher: Springer
• Publication Date: 2010
• Language: English
• ISBN 10: 3642083722
• ISBN 13: 9783642083723
• Binding: Soft cover
• Condition: New

About this title

Synopsis

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

From the Back Cover

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.