Scanning Electron Microscopy/1980/III: An International Journal of Scanning Electron Microscopy, Related Techniques, and Applications: Part III

Johari, Om & Becker, Robert P. (eds)

Published by Scanning Electron Microscopy, Inc., AMF O'Hare (Chicago), Illinois, 1980
Condition: Used - Near fine Hardcover

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Used - Hardcover

Condition: Used - Near fine

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