Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces - Oxford Series in Optical and Imaging Sciences - Revised Edition

Sarid, Dror

ISBN 10: 019509204X / ISBN 13: 9780195092042

Published by Oxford University Press, New York, 1994

About this Item

263 Pages Indexed. Solid book in great condition. High interest and major advances in the technology of scanning force microscopy that have taken place since the 1991 release has made this Revised Edition necessary. The tenth anniversary of Scanning Tunneling Microscopy, celebrated at the Sixth International Conference on Scanning Tunneling Microscopy in Interlaken, Switzerland August 12-16, 1991, with more than one thousand participants, produced three volumes of papers that attest to the ever-growing interest in this technology. As the field of scanning force microscopy has matured, a gradual shift in gears has taken place, from activities involving the development of instruments to their use as probes in a large rainbow of disciplines. Therefore, this new print, which includes all the material contained in the first print, additionally has the latest available list of new references that deal with electric, magnetic, and atomic force microscopy. It should also be noted that several scanning force microscopy related reviews have appeared, some of which present detailed information on specialized topics. Contents in 13 Chapters: Mechanical Properties of Levers, Resonance Enhancement, Sources of Noise, Tuneling Detection System, Capacitance Detection System, Homodyne Detection System, Heterodyne Detection System, Laser-Diode Feedback Detection System, Polarization Detection System, Deflection System, Electric Force Microscopy, Magnetic Force Microscopy, and Atomic Force Microscopy.

Seller Inventory # 16182

Bibliographic Details

• Title: Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces - Oxford Series in Optical and Imaging Sciences - Revised Edition
• Publisher: Oxford University Press, New York
• Publication Date: 1994
• Language: English
• ISBN 10: 019509204X
• ISBN 13: 9780195092042
• Binding: Hard Back
• Edition: Revised Edition - Third Printing
• Condition: Very Good
• Dust Jacket Condition: No Dust Jacket

About this title

Synopsis

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

About the Author

Dror Sarid is at University of Arizona-Tucson.