This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. Series: Oxford Series in Optical & Imaging Sciences. Num Pages: 288 pages, halftones, line drawings, tables. BIC Classification: PDND; PHV. Category: (P) Professional & Vocational. Dimension: 242 x 161 x 21. Weight in Grams: 667. . 1994. Revised. hardcover. . . . . Books ship from the US and Ireland.

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Bibliographic Details

Title: Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces: 5 (Oxford Series in Optical and Imaging Sciences)
Publisher: OUP USA
Publication Date: 1994
Language: English
ISBN 10: 019509204X
ISBN 13: 9780195092042
Binding: Hardcover
Condition: New

About this title

Synopsis

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

About the Author

Dror Sarid is at University of Arizona-Tucson.

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