Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

Adam S. Foster

ISBN 10: 1441923063 / ISBN 13: 9781441923066

Published by Springer, 2006

About this Item

281 pages. 9.00x6.00x0.70 inches. In Stock.

Seller Inventory # x-1441923063

Bibliographic Details

• Title: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
• Publisher: Springer
• Publication Date: 2006
• Language: English
• ISBN 10: 1441923063
• ISBN 13: 9781441923066
• Binding: Paperback
• Condition: Brand New
• Weight: 0.51 kilograms

About this title

Synopsis

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.

 

Key Features

• Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
• Provides a framework for linking scanning probe theory and simulations with experimental data
• Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations

From the Back Cover

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.