Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
Language: English
Published by Springer, 2006
- Hardcover
- Used

Seller: CONTINENTAL MEDIA & BEYOND, Ocala, FL, U.S.A.CONTINENTAL MEDIA & BEYOND
AbeBooks seller since August 26, 2008
Condition: Used - Very good
US$ 100.00
Quantity: 1 available
Add to basketItem description from seller
2006 hardcover no dust jacket as issued clean crisp unmarked pages top edge of pages has age foxing 281 pages K-9.
Seller Inventory # 1106H5FPRO2
- Title
- Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
- Author
- Foster, Adam; Hofer, Werner A.
- Publisher
- Springer
- Publication year
- 2006
- Condition
- Used: Very Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0387400907
- ISBN 13
- 9780387400907
Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.
Key Features
- Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
- Provides a framework for linking scanning probe theory and simulations with experimental data
- Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations
"Synopsis" may belong to another edition of this title.
From the Back Cover
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
"About the title" may belong to another edition of this title.
CONTINENTAL MEDIA & BEYOND
Ocala, FL, U.S.A.
AbeBooks seller since August 26, 2008
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CONTINENTAL MEDIA & BEYOND
FL, U.S.A.
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