Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

Language: English

Published by Springer, 2006

0387400907 / 9780387400907

  • Hardcover
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Seller: CONTINENTAL MEDIA & BEYOND, Ocala, FL, U.S.A.CONTINENTAL MEDIA & BEYOND

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2006 hardcover no dust jacket as issued clean crisp unmarked pages top edge of pages has age foxing 281 pages K-9.

Seller Inventory # 1106H5FPRO2

Title
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
Author
Foster, Adam; Hofer, Werner A.
Publisher
Springer
Publication year
2006
Condition
Used: Very Good
Binding
Hardcover
Language
English
ISBN 10
0387400907
ISBN 13
9780387400907

CONTINENTAL MEDIA & BEYOND

Ocala, FL, U.S.A.

5-star seller

AbeBooks seller since August 26, 2008

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CONTINENTAL MEDIA & BEYOND

FL, U.S.A.