Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale

Alexei Gruverman

ISBN 10: 0387286675 / ISBN 13: 9780387286679

Published by Springer New York, Springer New York, 2006

About this Item

Druck auf Anfrage Neuware - Printed after ordering - Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Seller Inventory # 9780387286679

Bibliographic Details

• Title: Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale
• Publisher: Springer New York, Springer New York
• Publication Date: 2006
• Language: English
• ISBN 10: 0387286675
• ISBN 13: 9780387286679
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 67D millimeters 241 millimeters width by 160 millimeters height by 67 millimeters depth
• Weight: 1879 grams

About this title

Synopsis

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.