Scanning Probe Microscopy of Functional Materials

Language: English

Published by Springer New York Dez 2010, 2010

144196567X / 9781441965677

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. 576 pp. Englisch.…

Seller Inventory # 9781441965677

Title
Scanning Probe Microscopy of Functional Materials
Author
Alexei Gruverman
Publisher
Springer New York Dez 2010
Publication year
2010
Condition
Neu
Binding
Buch
Language
English
ISBN 10
144196567X
ISBN 13
9781441965677
Item weight
1,021 grams
Dimensions
241x160x37 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

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BuchWeltWeit Ludwig Meier e.K.

Germany