Scanning Probe Microscopy of Functional Materials

Language: English

Published by Springer New York, Springer US Aug 2016, 2016

1493939475 / 9781493939473

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This item is printed on demand - Print on Demand Titel. Neuware -The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 576 pp. Englisch.…

Seller Inventory # 9781493939473

Title
Scanning Probe Microscopy of Functional Materials
Author
Alexei Gruverman
Publisher
Springer New York, Springer US Aug 2016
Publication year
2016
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1493939475
ISBN 13
9781493939473
Item weight
861 grams
Dimensions
235x155x31 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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