Scanning Probe Microscopy of InAs/InP Nanowires

Language: English

Published by GRIN Verlag, GRIN Verlag Okt 2011, 2011

3656010498 / 9783656010494

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Bachelor Thesis from the year 2011 in the subject Physics - Other, grade: 1,0, LMU Munich, language: English, abstract: In this thesis the InAs(111)B surface and III-V semiconductor nanowires are investigated using scanning tunneling microscopy and spectroscopy. The morphology of InAs nanowires grown without gold particle is studied. Radial nanowire heterostructure such as InP core with InAs shell are analyzed and the wurtzite top facet is identified. Furthermore nanowire heterostructures with an InP core and InAs shell with induced stacking faults possibly giving rise to quantum dots, which could be used as quantum dot lasers or for quantum information processing, are investigated. A model is obtained based on morphology analysis and as top facet the wurtzite and are found. Furthermore stacking faults on top of a nanowire are seen.The analysis of the InAs(111)B surface shows the hexagonal pattern. Defects are determined to occur due to missing In atoms in the first layer. Spectroscopy next to those defects indicated no influence on the local electronic structure. 64 pp. Englisch.

Seller Inventory # 9783656010494

Title
Scanning Probe Microscopy of InAs/InP Nanowires
Author
Stephan Pröller
Publisher
GRIN Verlag, GRIN Verlag Okt 2011
Publication year
2011
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3656010498
ISBN 13
9783656010494
Item weight
107 grams
Dimensions
210x148x5 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

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BuchWeltWeit Ludwig Meier e.K.

Germany