Scanning Probe Microscopy in Nanoscience and Nanotechnology. This item is unavailable.
Language: English
Published by Springer-Verlag GmbH, 2010
- Hardcover
- Used

Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermanyBUCHSERVICE / ANTIQUARIAT Lars Lutzer
AbeBooks seller since July 14, 2011
Condition: Used - Very good
US$ 468.67
Item description from seller
Scanning Probe Microscopy in Nanoscience and Nanotechnology In deutscher Sprache. pages.
Seller Inventory # BN360916
- Title
- Scanning Probe Microscopy in Nanoscience and Nanotechnology
- Publisher
- Springer-Verlag GmbH
- Publication year
- 2010
- Condition
- gut
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 3642035345
- ISBN 13
- 9783642035340
- Edition
- 2010.
- Item weight
- 2,000 grams
"Synopsis" may belong to another edition of this title.
From the Back Cover
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
"About the title" may belong to another edition of this title.