Scanning Probe Microscopy in Nanoscience and Nanotechnology
Language: English
Published by Springer, 2010
- Hardcover
- New

Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
AbeBooks seller since March 25, 2015
Condition: New
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Seller Inventory # ria9783642035340_new
- Title
- Scanning Probe Microscopy in Nanoscience and Nanotechnology
- Publisher
- Springer
- Publication year
- 2010
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 3642035345
- ISBN 13
- 9783642035340
"Synopsis" may belong to another edition of this title.
From the Back Cover
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
"About the title" may belong to another edition of this title.
Ria Christie Collections
Uxbridge, United Kingdom
AbeBooks seller since March 25, 2015
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