Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology)

Bhushan, Bharat

ISBN 10: 3642035345 / ISBN 13: 9783642035340

Published by Springer, 2010

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Bibliographic Details

• Title: Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology)
• Publisher: Springer
• Publication Date: 2010
• Language: English
• ISBN 10: 3642035345
• ISBN 13: 9783642035340
• Binding: Hardcover
• Condition: Like New
• Book Type: book

About this title

Synopsis

Nature is the best example of a system functioning on the nanometer scale, wherethematerialsinvolved, energyconsumption, anddatahandlingareop- mized. Opening the doors to the nanoworld, the emergence of the scanning tunneling microscope in 1982 and the atomic force microscope in 1986 led to a shift of paradigmin the understanding and perception of matter at its most fundamentallevel. As aconsequence, newrevolutionaryconceptsstimulateda number of new technologies. The current volume Scanning Probe Methods in Nanoscience and Nanotechnology showsthat these methods arestill making a tremendous impact on many disciplines that range from fundamental physics andchemistry throughinformationtechnology, spintronics, quantumcomp- ing, and molecular electronics, all the way to life sciences. Indeed, over 6,000 AFM-related papers were published in 2008 alone, bringing the total to more than 70,000 since its invention, according to the web of science, and the STM has inspired a total of 20,000 papers. There are also more than 500 patents related to the various forms of scanning probe microscopes. Commerciali- tion of the technology started at the end of the 1980s, and approximately 12,000 commercial systems have been sold so far to customers in areas as diverse as fundamental research, the car industry, and even the fashion ind- try. There are also a signi?cant number of home-built systems in operation. Some60-80companiesareinvolvedinmanufacturingSPMandrelatedinst- ments. Indeed, not even the sky seems to be the limit for AFM technology. TheRosettamissiontocomet67Plaunchedbythe EuropeanSpaceAgencyin 2004 includes an AFM in its MIDAS (Micro-Imaging Dust Analysis System) instrument.

From the Back Cover

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and  typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber