Scanning Probe Microscopy and Spectroscopy : Methods and Applications

Roland Wiesendanger

ISBN 10: 0521418100 / ISBN 13: 9780521418102

Published by Cambridge University Press, 1994

About this Item

Druck auf Anfrage Neuware - Printed after ordering - The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunneling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, including topographic imaging, local tunneling barrier height measurements, tunneling spectroscopy, and local potentiometry. A treatment of the experimental techniques used in scanning force microscopy and other scanning probe techniques rounds out this section. The second part discusses representative applications of these techniques in fields such as condensed matter physics, chemistry, materials science, biology, and nanotechnology, so this book will be extremely valuable to upper-division students and researchers in these areas.

Seller Inventory # 9780521418102

Bibliographic Details

• Title: Scanning Probe Microscopy and Spectroscopy : Methods and Applications
• Publisher: Cambridge University Press
• Publication Date: 1994
• Language: English
• ISBN 10: 0521418100
• ISBN 13: 9780521418102
• Binding: Buch
• Condition: Neu
• Dimensions: 235W x 157H x 43D millimeters 235 millimeters width by 157 millimeters height by 43 millimeters depth
• Weight: 1207 grams

About this title

Synopsis

The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunneling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, including topographic imaging, local tunneling barrier height measurements, tunneling spectroscopy, and local potentiometry. A treatment of the experimental techniques used in scanning force microscopy and other scanning probe techniques rounds out this section. The second part discusses representative applications of these techniques in fields such as condensed matter physics, chemistry, materials science, biology, and nanotechnology, so this book will be extremely valuable to upper-division students and researchers in these areas.

Book Description

Beginning with the theoretical background of the technique, the design and instrumentation of practical scanning tunneling microscopy and associated systems are described in detail.