Scanning and Transmission Electron Microscopy: An Introduction

Flegler, Stanley L.; Heckman Jr., John W.; Klomparens, Karen L.

ISBN 10: 0716770474 / ISBN 13: 9780716770473

Published by Oxford University Press, 1993

About this Item

A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.

Seller Inventory # OTV.0716770474.G

Bibliographic Details

• Title: Scanning and Transmission Electron Microscopy: An Introduction
• Publisher: Oxford University Press
• Publication Date: 1993
• Language: English
• ISBN 10: 0716770474
• ISBN 13: 9780716770473
• Binding: Hardcover
• Condition: good

About this title

Synopsis

This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmission electron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.

About the Author

Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.