Scanning tunneling microscopy II: Further applications and related scanning techniques.

Baumeister, Wolfgang:

ISBN 10: 3540585893 / ISBN 13: 9783540585893

Published by Berlin, Springer, 1995

About this Item

XIV, 349 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16256 9783540585893 Sprache: Englisch Gewicht in Gramm: 550.

Seller Inventory # 2479688

Bibliographic Details

• Title: Scanning tunneling microscopy II: Further applications and related scanning techniques.
• Publisher: Berlin, Springer
• Publication Date: 1995
• Language: English
• ISBN 10: 3540585893
• ISBN 13: 9783540585893
• Binding: Softcover
• Edition: Second ed.
• Condition: Gut
• Weight: 550 grams
• Seller catalogs:
  • SA MATHEMATIK

About this title

Synopsis

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.

From the Back Cover

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed.