Scientific Computing in Electrical Engineering | SCEE 2014, Wuppertal, Germany, July 2014

Andreas Bartel (u. a.)

ISBN 10: 3319808001 / ISBN 13: 9783319808000

Published by Springer, 2018

About this Item

Scientific Computing in Electrical Engineering | SCEE 2014, Wuppertal, Germany, July 2014 | Andreas Bartel (u. a.) | Taschenbuch | Mathematics in Industry | xi | Englisch | 2018 | Springer | EAN 9783319808000 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Seller Inventory # 114226193

Bibliographic Details

• Title: Scientific Computing in Electrical Engineering | SCEE 2014, Wuppertal, Germany, July 2014
• Publisher: Springer
• Publication Date: 2018
• Language: English
• ISBN 10: 3319808001
• ISBN 13: 9783319808000
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 15D millimeters 235 millimeters width by 155 millimeters height by 15 millimeters depth
• Weight: 411 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

This book is a collection of selected papers presented at the 10th International Conference on Scientific Computing in Electrical Engineering (SCEE), held in Wuppertal, Germany in 2014. The book is divided into five parts, reflecting the main directions of SCEE 2014: 1. Device Modeling, Electric Circuits and Simulation, 2. Computational Electromagnetics, 3. Coupled Problems, 4. Model Order Reduction, and 5. Uncertainty Quantification. Each part starts with a general introduction followed by the actual papers. 

The aim of the SCEE 2014 conference was to bring together scientists from academia and industry, mathematicians, electrical engineers, computer scientists, and physicists, with the goal of fostering intensive discussions on industrially relevant mathematical problems, with an emphasis on the modeling and numerical simulation of electronic circuits and devices, electromagnetic fields, and coupled problems. The methodological focus was on model order reduction anduncertainty quantification.