Seeker general test basic manual(Chinese Edition)
LI ZHI . WANG HONG QIANG DENG ZHU
Sold by liu xing, Nanjing, JS, China
AbeBooks Seller since April 7, 2009
New - Soft cover
Condition: New
Quantity: 1 available
Add to basketSold by liu xing, Nanjing, JS, China
AbeBooks Seller since April 7, 2009
Condition: New
Quantity: 1 available
Add to basketPaperback. Pub Date: 2018-07-01 Pages: 252 Language: Chinese Publisher: National Defense Industry Press. General Guide for Guided Heads from the perspective of test and test. guided by the guidance of common technology in the field of weapons and equipment advance research The head machine system and the seeker information processor are the objects. and the system describes its test specifications and nouns.
Seller Inventory # NL015369
"About this title" may belong to another edition of this title.
We guarantee the condition of every book as it's described on the Abebooks web sites. If you're dissatisfied with your purchase (Incorrect Book/Not as Described/Damaged) or if the order hasn't arrived, you're eligible for a refund within 30 days of the estimated delivery date. If you've changed your mind about a book that you've ordered, please use the Ask bookseller a question link to contact us and we'll respond within 2 business days. Please Note:We don't sell any international Edition to you...
Most orders are shipped within 24 hours. We will delivery these items to you by AIRMAIL, EUB, EMS, TNT etc.
| Order quantity | 16 to 30 business days | 8 to 16 business days |
|---|---|---|
| First item | US$ 18.00 | US$ 30.00 |
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.