Semiconductor Material and Device Characterization
Language: English
Published by Wiley-Interscience, 1990
- Hardcover
- New

Seller: The Book Spot, North Branch, MN, U.S.A.The Book Spot
AbeBooks seller since February 5, 2013
Condition: New
US$ 89.00
Quantity: 1 available
Add to basketSeller Inventory # Abebooks128187
- Title
- Semiconductor Material and Device Characterization
- Author
- Schroder, Dieter K.
- Publisher
- Wiley-Interscience
- Publication year
- 1990
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0471511048
- ISBN 13
- 9780471511045
"Synopsis" may belong to another edition of this title.
From the Back Cover
This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate the field during the past decade. From scanning probe techniques to the detection of metallic impurities in silicon wafers to the use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous edition first came out. Featured here are:
* An entirely new chapter on reliability and probe microscopy
* Numerous examples and end-of-chapter problems - new to this edition
* Five hundred illustrations revised for this edition
* Updated bibliography with over 1,200 references
* Easy-to-use text including a real-world mix of units rather than strictly MKS units.
This practical new edition is ideal for textbook adoptions at the graduate level and is destined to become an essential reference for research and development teams in the semiconductor industry.
"About the title" may belong to another edition of this title.
The Book Spot
North Branch, MN, U.S.A.
AbeBooks seller since February 5, 2013
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The Book Spot
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