Semiconductor Memories: Technology, Testing, and Reliability

Ashok K Sharma

ISBN 10: 0780310004 / ISBN 13: 9780780310001

Published by Wiley-IEEE Press, 2002

About this Item

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.

Seller Inventory # CIN0780310004A

Bibliographic Details

• Title: Semiconductor Memories: Technology, Testing, and Reliability
• Publisher: Wiley-IEEE Press
• Publication Date: 2002
• Language: English
• ISBN 10: 0780310004
• ISBN 13: 9780780310001
• Binding: Hardback
• Condition: Fair

About this title

Synopsis

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

About the Author

ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.