Semiconductor Memories: Technology, Testing, and Reliability
Language: English
Published by Wiley-IEEE Press, 2002
- Hardcover
- New
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- Title
- Semiconductor Memories: Technology, Testing, and Reliability
- Author
- Sharma, Ashok K.
- Publisher
- Wiley-IEEE Press
- Publication year
- 2002
- Condition
- new
- Binding
- hardcover
- Language
- English
- ISBN 10
- 0780310004
- ISBN 13
- 9780780310001
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
"Synopsis" may belong to another edition of this title.
About the Author
ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.
"About the title" may belong to another edition of this title.
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