Sequential Logic Testing and Verification

Ghosh, Abhijit; Devadas, Srinivas; Newton, A. Richard

ISBN 10: 1461366224 / ISBN 13: 9781461366225

Published by Springer-Verlag New York Inc., 2012

About this Item

Series: The Springer International Series in Engineering and Computer Science. Num Pages: 214 pages, biography. BIC Classification: THR; TJFC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 373. . 2012. Softcover reprint of the original 1st ed. 1992. Paperback. . . . .

Seller Inventory # V9781461366225

Bibliographic Details

• Title: Sequential Logic Testing and Verification
• Publisher: Springer-Verlag New York Inc.
• Publication Date: 2012
• Language: English
• ISBN 10: 1461366224
• ISBN 13: 9781461366225
• Binding: Soft cover
• Condition: New

About this title

Synopsis

In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care­ fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte­ gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.