Soft Error Tolerant System

Md. Nazim Uddin

ISBN 10: 3659339156 / ISBN 13: 9783659339158

Published by LAP Lambert Academic Publishing, 2013

About this Item

nach der Bestellung gedruckt Neuware - Printed after ordering - Soft error is a significant reliability concern for nanometer technologies. Shrinking feature sizes, lower voltage levels, reduced noise margins, and increased clock frequency improves the performance and lowers the power consumption of integrated circuit. But it causes the integrated circuit more susceptible to soft error that can corrupt data and make systems vulnerable. The device shrinking reduces the soft error tolerance of the VLSI circuits, as very little energy is needed to change their states. In digital systems, where the reliability is a great concern, the impact of soft errors may be very catastrophic. Safety critical systems are very sensitive to soft errors. A bit flip due to soft error can change the value of critical variable. And consequently the system control flow can completely be changed which may lead to system failure. To minimize the soft error risks, critical blocks are identified by criticality analysis of the blocks and ranking among them. Highest ranked blocks are considered as critical block. Refactoring is applied to minimize the criticality of the critical blocks. Then a novel methodology is proposed to detect and recover from soft errors.

Seller Inventory # 9783659339158

Bibliographic Details

• Title: Soft Error Tolerant System
• Publisher: LAP Lambert Academic Publishing
• Publication Date: 2013
• Language: English
• ISBN 10: 3659339156
• ISBN 13: 9783659339158
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 4D millimeters 220 millimeters width by 150 millimeters height by 4 millimeters depth
• Weight: 113 grams

About this title

Synopsis

Soft error is a significant reliability concern for nanometer technologies. Shrinking feature sizes, lower voltage levels, reduced noise margins, and increased clock frequency improves the performance and lowers the power consumption of integrated circuit. But it causes the integrated circuit more susceptible to soft error that can corrupt data and make systems vulnerable. The ‘device shrinking’ reduces the soft error tolerance of the VLSI circuits, as very little energy is needed to change their states. In digital systems, where the reliability is a great concern, the impact of soft errors may be very catastrophic. Safety critical systems are very sensitive to soft errors. A bit flip due to soft error can change the value of critical variable. And consequently the system control flow can completely be changed which may lead to system failure. To minimize the soft error risks, critical blocks are identified by criticality analysis of the blocks and ranking among them. Highest ranked blocks are considered as critical block. Refactoring is applied to minimize the criticality of the critical blocks. Then a novel methodology is proposed to detect and recover from soft errors.

About the Author

Md. Nazim Uddin received M.Sc. Eng. in Computer Science and Engineering (Ph.D on going) from Khulna University of Engineering and Technology, Bangladesh in 2012. He is the Member of The Institute of Engineers(IEB). He has published around 6 papers and book chapters in his area of expertise. His current research interests are in Embedded Systems.