Software Test Attacks to Break Mobile and Embedded Devices: 6 (Chapman & Hall/CRC Innovations in Software Engineering and Software Development Series)

Hagar, Jon Duncan

ISBN 10: 1466575301 / ISBN 13: 9781466575301

Published by CRC Press, 2014

About this Item

This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:9781466575301.

Seller Inventory # 8244163

Bibliographic Details

• Title: Software Test Attacks to Break Mobile and Embedded Devices: 6 (Chapman & Hall/CRC Innovations in Software Engineering and Software Development Series)
• Publisher: CRC Press
• Publication Date: 2014
• Language: English
• ISBN 10: 1466575301
• ISBN 13: 9781466575301
• Binding: Soft cover
• Condition: Good
• Weight: 800 grams
• Seller catalogs:
  • Computing

About this title

Synopsis

Address Errors before Users Find ThemUsing a mix-and-match approach, Software Test Attacks to Break Mobile and Embedded Devices presents an attack basis for testing mobile and embedded systems. Designed for testers working in the ever-expanding world of "smart" devices driven by software, the book focuses on attack-based testing that can be used by individuals and teams. The numerous test attacks show you when a software product does not work (i.e., has bugs) and provide you with information about the software product under test.

The book guides you step by step starting with the basics. It explains patterns and techniques ranging from simple mind mapping to sophisticated test labs. For traditional testers moving into the mobile and embedded area, the book bridges the gap between IT and mobile/embedded system testing. It illustrates how to apply both traditional and new approaches. For those working with mobile/embedded systems without an extensive background in testing, the book brings together testing ideas, techniques, and solutions that are immediately applicable to testing smart and mobile devices.

About the Author

Jon Hagar is the principal (CEO/CTO) and senior software test engineer at Grand Software Testing. For over 30 years he has worked on systems and software engineering, specializing in testing/verification and validation. He is the lead editor on ISO/IEC/IEEE29119 Software Test Standard, a member of the IEEE1012 V&V Plan working group, and co-chair on the OMG UML testing profile standard. Jon holds a patent on web test technologies and has published numerous articles on software reliability, testing, test tools, formal methods, and embedded systems. He has a B.S. in mathematics with a specialization in civil engineering and software from Metropolitan State College in Denver, Colorado, and an M.S. in computer science with a specialization in software engineering and testing from Colorado State University.