Spatial Point Patterns

Language: English

Published by Chapman And Hall/CRC Nov 2015, 2015

1482210207 / 9781482210200

Series: Book 1 of 1 - Chapman & Hall/CRC Interdisciplinary Statistics

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. 830 pp. Englisch.

Seller Inventory # 9781482210200

Title
Spatial Point Patterns
Author
Ege Rubak
Publisher
Chapman And Hall/CRC Nov 2015
Publication year
2015
Condition
Neu
Binding
Buch
Language
English
ISBN 10
1482210207
ISBN 13
9781482210200
Item weight
1,725 grams
Dimensions
260x183x49 mm
Series
Book 1 of 1: Chapman & Hall/CRC Interdisciplinary Statistics

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First itemUS$ 26.68US$ 26.68
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BuchWeltWeit Ludwig Meier e.K.

Germany