Spectrum and Network Measurements (Electromagnetic Waves)

Witte, Robert A.

ISBN 10: 1613530145 / ISBN 13: 9781613530146

Published by Scitech Publishing, 2014

About this Item

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Bibliographic Details

• Title: Spectrum and Network Measurements (Electromagnetic Waves)
• Publisher: Scitech Publishing
• Publication Date: 2014
• Language: English
• ISBN 10: 1613530145
• ISBN 13: 9781613530146
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: Good

About this title

Synopsis

This updated edition of the industry's classic text combines the theory, practice, and latest technology of spectrum and network measurements in electronic systems to offer a comprehensive and easy way to understand frequency domain measurements.

Spectrum and Network Measurements, 2nd Edition has been completely updated to take into account the latest technology, particularly focusing on the shift from analog to digital in communication systems, plus an important new chapter on EMC measurements of radiated and conducted emissions has also been added. Using simplified block diagrams, this book offers a thorough coverage of critical concepts, such as decibels, Fourier analysis, noise effects, impedance matching, intermodulation distortion, reflection measurements, and S-Parameters.

By picking up where the majority of electrical engineering programs stop, this title takes basic EE theory and translates it to the world of electronic measurements. This enables the reader to understand the basic theory of signals and systems, relate it to measured results, and apply it when creating new designs.

About the Author

Robert A. Witte received a BSEE degree from Purdue University and MSEE degree from Colorado State University. He has spent his entire career in the test and measurement industry, working for Hewlett-Packard, Agilent Technologies, and Keysight Technologies. Robert has contributed to the development of spectrum analyzers, network analyzers, oscilloscopes and other instruments. He has held a number of R&D management positions and is currently the Vice President of Technology Leadership for Keysight Technologies. Robert is also the author of Electronic Test Instruments: Analog and Digital Measurements.