Statistical Methods for SPC and TQM (Chapman & Hall/CRC Texts in Statistical Science)

Bissell, D

ISBN 10: 0412394405 / ISBN 13: 9780412394409

Published by Chapman and Hall/CRC, 1994

About this Item

Gently read. May have name of previous ownership, or ex-library edition. Binding tight; spine straight and smooth, with no creasing; covers clean and crisp. Minimal signs of handling or shelving. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships USPS Media Mail.

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Bibliographic Details

• Title: Statistical Methods for SPC and TQM (Chapman & Hall/CRC Texts in Statistical Science)
• Publisher: Chapman and Hall/CRC
• Publication Date: 1994
• Language: English
• ISBN 10: 0412394405
• ISBN 13: 9780412394409
• Binding: Hardcover
• Condition: very_good

About this title

Synopsis

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; "Significance Tests" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for "Single-Valued" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in "Non-Product" Applications Appendices

About the Author

D Bissell