Statistical Methods for SPC and TQM

Chatfield, Chris (Series edited by)/ Zidek, Jim (Series edited by)/ Lindsey, Jim (Series edited by)/ Bissell, D (Author)

ISBN 10: 0412394405 / ISBN 13: 9780412394409

Published by Chapman & Hall, 1994

About this Item

384 pages. 9.50x6.50x0.75 inches. In Stock.

Seller Inventory # __0412394405

Bibliographic Details

• Title: Statistical Methods for SPC and TQM
• Publisher: Chapman & Hall
• Publication Date: 1994
• Language: English
• ISBN 10: 0412394405
• ISBN 13: 9780412394409
• Binding: Hardcover
• Condition: Brand New

About this title

Synopsis

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; "Significance Tests" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for "Single-Valued" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in "Non-Product" Applications Appendices

About the Author

D Bissell