Statistical Pattern Recognition
Webb, Andrew R.
Sold by Bay State Book Company, North Smithfield, RI, U.S.A.
AbeBooks Seller since January 23, 2023
Used - Soft cover
Condition: Used - Good
Ships within U.S.A.
Quantity: 1 available
Add to basketSold by Bay State Book Company, North Smithfield, RI, U.S.A.
AbeBooks Seller since January 23, 2023
Condition: Used - Good
Quantity: 1 available
Add to basketThe book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
Seller Inventory # BSM.1DQ5S
Statistical Pattern Recognition, Second Edition has been fully updated with new methods, applications and references. It provides a comprehensive introduction to this vibrant area - with material drawn from engineering, statistics, computer science and the social sciences - and covers many application areas, such as database design, artificial neural networks, and decision support systems.
* Provides a self-contained introduction to statistical pattern recognition.
* Each technique described is illustrated by real examples.
* Covers Bayesian methods, neural networks, support vector machines, and unsupervised classification.
* Each section concludes with a description of the applications that have been addressed and with further developments of the theory.
* Includes background material on dissimilarity, parameter estimation, data, linear algebra and probability.
* Features a variety of exercises, from 'open-book' questions to more lengthy projects.
The book is aimed primarily at senior undergraduate and graduate students studying statistical pattern recognition, pattern processing, neural networks, and data mining, in both statistics and engineering departments. It is also an excellent source of reference for technical professionals working in advanced information development environments.
For further information on the techniques and applications discussed in this book please visit www.statistical-pattern-recognition.net
"About this title" may belong to another edition of this title.
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