Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction, X-Ray, Electron and Ion Spectrometry, Electron Microscopy Eberhart, Jean Pierre

Eberhart, Jean Pierre

ISBN 10: 0471929778 ISBN 13: 9780471929772
Published by John Wiley & Sons Ltd, 1991
Language: English
Condition: Used - Very good Hardcover

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Used - Hardcover

Condition: Used - Very good

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