Structural and Residual Stress Analysis by Nondestructive Methods
Language: English
Published by Elsevier Science and Technology, GB, 1997
- Hardcover
- New

Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
AbeBooks seller since June 11, 2025
Condition: New
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Add to basketItem description from seller
The field of stress analysis has gained its momentum from the widespread applications in industry and technology and has now become an important part of materials science. Various destructive as well as nondestructive methods have been developed for the determination of stresses. This timely book provides a comprehensive review of the nondestructive techniques for strain evaluation written by experts in their respective fields.The main part of the book deals with X-ray stress analysis (XSA), focussing on measurement and evaluation methods which can help to solve the problems of today, the numerous applications of metallic, polymeric and ceramic materials as well as of thin-film-substrate composites and of advanced microcomponents. Furthermore it contains data, results, hints and recommendations that are valuable to laboratories for the certification and accreditation of their stress analysis.Stress analysis is an active field in which many questions remain unsettled. Accordingly, unsolved problems and conflicting results are discussed as well. The assessment of the experimentally determined residual and structural stress states on the static and dynamic behavior of materials and components is handled in a separate chapter.Students and engineers of materials science and scientists working in laboratories and industries will find this book invaluable. …
Seller Inventory # LU-9780444824769
- Title
- Structural and Residual Stress Analysis by Nondestructive Methods
- Author
- V. Hauk
- Publisher
- Elsevier Science and Technology, GB
- Publication year
- 1997
- Condition
- New
- Binding
- Hardback
- Language
- English
- ISBN 10
- 0444824766
- ISBN 13
- 9780444824769
- Item weight
- 1,370 grams
The main part of the book deals with X-ray stress analysis (XSA), focussing on measurement and evaluation methods which can help to solve the problems of today, the numerous applications of metallic, polymeric and ceramic materials as well as of thin-film-substrate composites and of advanced microcomponents. Furthermore it contains data, results, hints and recommendations that are valuable to laboratories for the certification and accreditation of their stress analysis.
Stress analysis is an active field in which many questions remain unsettled. Accordingly, unsolved problems and conflicting results are discussed as well. The assessment of the experimentally determined residual and structural stress states on the static and dynamic behavior of materials and components is handled in a separate chapter.
Students and engineers of materials science and scientists working in laboratories and industries will find this book invaluable.
"Synopsis" may belong to another edition of this title.
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