Structural, Syntactic, And Statistical Pattern Recognition: Joint Iapr International Workshops, Sspr 2006 And Spr 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Yeung, Dit-Yan (Editor)/ Kwok, James T. (Editor)/ Fred, Ana (Editor)/ Roli, Fabio (Editor)/ De Ridder, Dick (Editor)

ISBN 10: 3540372369 / ISBN 13: 9783540372363

Published by Springer Verlag, 2006

About this Item

1st edition. 939 pages. 9.25x6.25x1.00 inches. In Stock.

Seller Inventory # x-3540372369

Bibliographic Details

• Title: Structural, Syntactic, And Statistical Pattern Recognition: Joint Iapr International Workshops, Sspr 2006 And Spr 2006, Hong Kong, China, August 17-19, 2006, Proceedings
• Publisher: Springer Verlag
• Publication Date: 2006
• Language: English
• ISBN 10: 3540372369
• ISBN 13: 9783540372363
• Binding: Paperback
• Condition: Brand New
• Weight: 1.43 kilograms

About this title

Synopsis

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.