Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17 19, 2018, Proceedings (Lecture Notes in Computer Science)

Bai, Xiao (Editor) / Hancock, Edwin R. (Editor) / Ho, Tin Kam (Editor) / Wilson, Richard C. (Editor) / Biggio, Battista (Editor) / Robles-Kelly, Antonio (Editor)

ISBN 10: 3319977849 ISBN 13: 9783319977843
Published by Springer, 2018
Language: English
New Condition: Brand New Soft cover

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