Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17 19, 2018, Proceedings (Lecture Notes in Computer Science)
Bai, Xiao (Editor) / Hancock, Edwin R. (Editor) / Ho, Tin Kam (Editor) / Wilson, Richard C. (Editor) / Biggio, Battista (Editor) / Robles-Kelly, Antonio (Editor)
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