Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, September 8-11, 2020, Proceedings

Torsello, Andrea (Editor)/ Rossi, Luca (Editor)/ Pelillo, Marcello (Editor)/ Biggio, Battista (Editor)/ Robles-kelly, Antonio (Editor)

ISBN 10: 3030739724 / ISBN 13: 9783030739720

Published by Springer-Nature New York Inc, 2021

About this Item

390 pages. 9.25x6.10x0.94 inches. In Stock.

Seller Inventory # x-3030739724

Bibliographic Details

• Title: Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, September 8-11, 2020, Proceedings
• Publisher: Springer-Nature New York Inc
• Publication Date: 2021
• Language: English
• ISBN 10: 3030739724
• ISBN 13: 9783030739720
• Binding: Paperback
• Condition: Brand New
• Weight: 0.55 kilograms

About this title

Synopsis

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.