Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings

Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)

ISBN 10: 3319977849 / ISBN 13: 9783319977843

Published by Springer, 2018

About this Item

Seller Inventory # 33406442-n

Bibliographic Details

• Title: Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
• Publisher: Springer
• Publication Date: 2018
• Language: English
• ISBN 10: 3319977849
• ISBN 13: 9783319977843
• Binding: Soft cover
• Condition: New

About this title

Synopsis

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.

The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.