Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings

Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)

ISBN 10: 3030739724 ISBN 13: 9783030739720
Published by Springer, 2021
Language: English
New Condition: New Soft cover

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