Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings

ISBN 10: 3540440119 ISBN 13: 9783540440116
Published by Springer, 2002
Language: English
Condition: New Soft cover

Sold by Ria Christie Collections, Uxbridge, United Kingdom

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