Structural, Syntactic, and Statistical Pattern Recognition | Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Dit-Yan Yeung (u. a.)

ISBN 10: 3540372369 / ISBN 13: 9783540372363

Published by Springer, 2006

About this Item

Structural, Syntactic, and Statistical Pattern Recognition | Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings | Dit-Yan Yeung (u. a.) | Taschenbuch | xxi | Englisch | 2006 | Springer | EAN 9783540372363 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Seller Inventory # 102173202

Bibliographic Details

• Title: Structural, Syntactic, and Statistical Pattern Recognition | Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
• Publisher: Springer
• Publication Date: 2006
• Language: English
• ISBN 10: 3540372369
• ISBN 13: 9783540372363
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 50W x 155H x 235D millimeters 50 millimeters width by 155 millimeters height by 235 millimeters depth
• Weight: 1431 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.